The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2003

Filed:

Mar. 27, 2001
Applicant:
Inventor:

Mark L. Janecek, Endicott, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 3/02 ; H05K 3/10 ;
U.S. Cl.
CPC ...
H05K 3/02 ; H05K 3/10 ;
Abstract

A method for detecting misalignment of layers of a multi-layer circuit board. A plurality of layers of electrically insulating material are formed. At least one artwork feature is formed on a surface of at least one of the layers of electrically insulating material in the vicinity of at least one edge of the at least one layer of electrically insulating material. At least one reference point is formed on the at least one layer of electrically insulating material. The layers of electrically insulating material are joined together. The at least one artwork feature is exposed by removing a portion of the at least one layer of electrically insulating material. A location of the at least one artwork feature relative to the at least one reference point is visually determined, thereby detecting misalignment of the layers of electrically insulating material.


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