The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Jul. 19, 2001
Kenichiro Sonoda, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
An object of the present invention is to provide a measuring device and a measuring method capable of determining the number of averaging (the number of measurements automatically made in the measuring device) in the measuring device performing averaging process (automatically making plural measurements on a certain characteristic amount of a sample, and performing a process such as weight assignment, thereby obtaining an average value of measured results obtained from the plural measurements and outputting the average value as the measured result of the sample) while maintaining compatibleness of required measuring accuracy and efficiency in measurements. 1/&egr; ·(&sgr; /&sgr; ) ·N is calculated using a standard deviation &sgr; obtained from plural measurements made on one of a plurality of samples, a standard deviation &sgr; obtained from measurements made on the plurality of samples, an initial value N of the number of averaging and a desired ratio of uncertainties &egr; , and an integer not lower than the calculated result is employed as the number of averaging N. Then, the averaging process is again performed on each of the plurality of samples by the number of averaging N while performing measurements, thereby calculating the standard deviation &sgr; .