The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Mar. 01, 2001
Christopher John Engel, Rochester, MN (US);
Norman Karl James, Liberty Hill, TX (US);
Brian Chan Monwai, Austin, TX (US);
Kevin F. Reick, Austin, TX (US);
Philip George Shephard, III, Round Rock, TX (US);
Marco Zamora, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Repairing arrays on a processor with an on chip built in self test engine on the processor is provided. A subset of the arrays is selected for testing. Data patterns are sent from the test engine to the subset of arrays at a plurality of operating parameters. A response is received at the test engine from the subset of arrays at the operating parameters. The received response is compared to an expected response using the test engine, wherein the processor controller determines if additional test failures were detected by the test engine for the subset of arrays with a plurality of JTAG based instructions. Code in the processor controller then determines the states that need to be scanned into the scannable latches to force the array control logic to choose additional spare wordlines and/or bitlines to repair the newly identified failures in addition to all previously defined repair actions.