The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Dec. 20, 2001
Applicant:
Inventor:

Takefumi Namiki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/300 ;
U.S. Cl.
CPC ...
G01R 1/300 ;
Abstract

An electromagnetic wave analyzer and program which can handle non-uniform cells with smaller computation errors. A given computational domain is divided into a plurality of cells for the purpose of finite difference approximation. For each space point, a cell size identification unit identifies the uniformity of surrounding cells. When the surrounding cells are identified as being uniform in size, a first calculation unit calculates electromagnetic field components at that space point with a first calculation method. When the surrounding cells are identified as being non-uniform in size, a second calculation unit calculates the same with a second calculation method which has smaller computational errors than the first calculation method. A data output unit then outputs the calculated electromagnetic field values.


Find Patent Forward Citations

Namiki, Takefumi. (2003). Electromagnetic wave analyzer and program for same (U.S. Patent No. 6662125). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6662125

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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