The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Mar. 21, 2000
Applicant:
Inventors:

Jeffrey F. Skolnick, Vienna, VA (US);

Edward R. Barrientos, Great Falls, VA (US);

Sean M. Beliveau, Leesburg, VA (US);

Thomas M. Hedges, Great Falls, VA (US);

Eric J. Lundberg, Reston, VA (US);

Edmund S. Pendleton, Arlington, VA (US);

Roger Wells, Kensington, MD (US);

Assignee:

ARC Second Inc., Dulles, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 2/126 ;
U.S. Cl.
CPC ...
G01C 2/126 ;
Abstract

A method and system allows conversion of three-dimensional data from a default coordinate frame to an arbitrary user-selected coordinate frame. The method includes obtaining position data in a default coordinate frame and transforming the data into an alternate coordinate frame defined by the user. The alternate coordinate frame can be defined by allowing the user to select a plane, an origin, and an axis, using any desired coordinate system and in any desired orientation. The transformed data allows presentation of position measurements in a form that is relevant to the user's specific application.


Find Patent Forward Citations

Loading…