The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Sep. 30, 2002
Applicant:
Inventor:

Wido Menhardt, Los Gatos, CA (US);

Assignee:

Cedara Software Corp., Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/304 ;
U.S. Cl.
CPC ...
G01N 2/304 ;
Abstract

A method for reconstructing two and three dimensional images of objects using X-ray image projections and iterative reconstruction techniques is provided. More specifically, the method provides an image of the object to be corrected. Two or more X-ray absorbance profiles of the image are obtained along two or more different projection directions. These profiles are compared with the corresponding absorbance profiles of the object substantially filled with an X-ray contrast agent and, based on this comparison, the image is corrected using the iterative reconstruction techniques. Before each iteration the pixels of the image are updated so that if the absorbance value of the pixel is below a preselected value then the pixel is set to 0, otherwise the pixel is set to the absorbance value corresponding to the concentration of the X-ray contrast agent within the object. The iteration stops when the difference between the absorbance profiles of the image and the object falls below a preselected value.


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