The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Sep. 18, 2000
Keiji Shioda, Hachioji, JP;
Kazuhito Nakanishi, Hachioji, JP;
Masakazu Mizoguchi, Tsukui-gun, JP;
Masahiko Kinukawa, Sagamihara, JP;
Wataru Ohno, Hachioji, JP;
Toru Shinmura, Hachioji, JP;
Koji Yasunaga, Hino, JP;
Takashi Fukaya, Tama, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
Provided is a surgical observational system capable of effectively displaying, in the field of an operating microscope, a real-time image obtained by means of an ultrasonic probe, for example, and a slice image obtained by a preoperative diagnosis on the location of the distal end portion of the probe or a three-dimensional image of an affected region, in association with an actual observational image obtained by means of the microscope. The surgical operation observational system is provided with two monitors in the operating microscope for the observation of the affected region to be operated. Images on the two monitors are alternatively superposed on the optical path of the operating microscope.