The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Feb. 13, 2002
C. J. Anthony Fernando, Durham, NC (US);
James E. Swon, Chapel Hill, NC (US);
Varian, Inc., Palo Alto, CA (US);
Abstract
A sample measurement and analysis system comprises a fiber-optic channel selecting apparatus, a plurality of optical source lines, a plurality of optical return lines, a plurality of sample test sites, and an optical receiving device. The selecting apparatus comprises an optical input selection device, an optical output selection device, and a controller element. The optical input selection device defines a first optical path running between a first input end and a first output end. The first output end is rotatable to a plurality of first index positions defined along a first circular path. The optical output selection device defines a second optical path running between a second input end and a second output end. The second input end is rotatable to a plurality of second index positions defined along a second circular path. The controller element communicates with the optical input selection device and the optical output selection device for selectively aligning the first optical path with the first index positions and the second optical path with the second index positions.