The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Feb. 07, 2001
Francis J. Deck, Madison, WI (US);
Richard C. Wieboldt, Verona, WI (US);
Thermo Electron Scientific Instruments Corporation, Madison, WI (US);
Abstract
Alignment of multiple beam paths in a microscope such as a Raman spectrographic microscope utilizes an alignment instrument that is mounted on the stage of the microscope and positioned by the operator until an aperture of the alignment instrument is at an intended focal point of the microscope. A light source within the alignment instrument is turned on to project light through the aperture which is passed on a return light beam path to the input aperture of a spectrograph where it is detected. Features are included in the return beam path to adjust the beam path until the light detected is maximized, thereby aligning the return beam path to the intended focal point. The light source in the alignment instrument is turned off and a light source in the microscope system, such as a laser, is activated to provide an illumination light beam on a beam path that extends through the objective lens of the microscope, which focuses the beam onto the alignment instrument. The illumination beam that passes through the aperture is detected by a detector within the alignment instrument. The illumination beam path is then adjusted until the detected light is maximized, thereby aligning the illumination beam path to the intended focal point.