The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
May. 12, 2000
Kazuo Yamaguchi, Yokohama, JP;
Takashi Minato, Yokohama, JP;
Shinzoo Nishiyama, Yokohama, JP;
Atsushi Murata, Yokohama, JP;
Naohiko Baba, Yokohama, JP;
Tsutomu Yoshiya, Yokohama, JP;
Kazumi Kawamoto, Yokohama, JP;
Kyouichi Yamamoto, Yokohama, JP;
Kazuo Aoyama, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method of manufacturing an optic transmission module assures a high reliability for the module by inspecting the character of a low bit error rate (BER) of the module quickly and accurately. The module is employed in an optical communication system (light transmission system) required to cope with information communication systems that are becoming faster and faster in operation and larger and larger in capacity. Also disclosed is a system and a method for inspection of the BER character which uses a rectangular wave pulse as an interference light to calculate a degradation quantity of a signal-to-noise ratio (S/N) on the basis of a simple theory, thereby inspecting the BER character by extrapolating a case in which there is no interference light (S/X=∞ or X=0) with use of a sign error rate theoretical value according to a bit error rate of a light signal measured according to the degradation quantity.