The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Oct. 24, 2002
Applicant:
Inventors:

Kyo-Seop Choo, Seoul, KR;

June-Ho Park, Kumi, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/182 ;
U.S. Cl.
CPC ...
H01L 2/182 ;
Abstract

An array substrate for use in an X-ray sensing device is fabricated using an etching stopper that enables good control of the etching process, and an electrode that prevents damage caused by static electricity generated during a dry-etching step. During fabrication, the array substrate includes a plurality of gate lines that are all electrically connected to an electrode pattern via gate line extensions and gate line contact holes. The electrode pattern causes the gate lines to have equipotentials, which reduces static electricity induced defects.


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Choo, Kyo-Seop. (2003). Method of fabricating an array substrate for an x-ray detector (U.S. Patent No. 6660567). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6660567

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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