The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Oct. 29, 2001
Applicant:
Inventor:

Alan E. Delahoy, Rocky Hill, NJ (US);

Assignee:

Energy Photovoltaics, Lawrenceville, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ; H01L 2/166 ; H01L 2/100 ;
U.S. Cl.
CPC ...
G01R 3/126 ; H01L 2/166 ; H01L 2/100 ;
Abstract

Chalcopyrite semiconductors, such as thin films of copper-indium-diselenide (CuInSe ), copper-gallium-diselenide (CuGaSe ), and Cu(In ,Ga )Se , all of which are sometimes generically referred to as CIGS, have become the subject of considerable interest and study for semiconductor devices in recent years. They are of particular interest for photovoltaic device or solar cell absorber applications. The quality of Cu(In,Ga)Se thin films, as an example of chalcopyrite films, is controlled by making spectrophotometric measurements of light reflected from the film surface. This permits the result of non-contacting measurements of films in a continuous production environment to be fed back to adjust the production conditions in order to improve or maintain the quality of subsequently produced film.


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