The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Mar. 27, 2001
Raymond A. Applegate, San Antonio, TX (US);
Larry N. Thibos, Bloomington, IN (US);
Other;
Abstract
Methods, systems, and media relating the display of scattering and/or absorption characteristics of an optical medium. For scattering measurements, a Hartmann-Shack calibration image of a measurement system is acquired to define a first plurality of point spread functions. A Hartmann-Shack test image of the medium is acquired to define a second plurality of point spread functions. A shift is determined between the test image and the calibration image. A point spread of each of the second plurality of point spread functions is measured, each of the second plurality of point spread functions including a component due to optical aberration of the medium and a component due to scatter. The component due to optical aberration is determined using the shift. The component due to optical aberration is deconvolved to determine the component due to scatter. A display of the local scattering characteristics is generated using the component due to scatter. For absorption measurements, a plurality of spot intensity measurements are acquired of a medium, each spot intensity measurement including a component due to reflectivity and a component due to absorption. The component due to reflectivity is determined, and the component due to absorption is determined.