The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Jan. 18, 2002
Applicant:
Inventors:
Graham H. Laycock, Singapore, SG;
Raymond S. P. Leung, Shatin New Territories, HK;
Tianyi Liao, Wilmington, DE (US);
Assignee:
E. I. du Pont de Nemours and Company, Wilmington, DE (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D03D 1/508 ;
U.S. Cl.
CPC ...
D03D 1/508 ;
Abstract
A warp-stretch twill fabric having a face side and a back side and comprising non-elastomeric ends and bare elastomeric ends wherein the ratio of non-elastomeric ends to bare elastomeric ends is from abut 2:1 to about 6:1; an elastomeric end face exposure count of 2 occurs less frequently than once per 10 picks; and the elastomeric ends float over no more than 3 picks on the face side.
Quick Actions:
Laycock, Graham. (2003). Warp-stretch woven fabric and method for making same (U.S. Patent No. 6659139). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6659139
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile