The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Jul. 20, 2000
Applicant:
Inventors:

Aviram Cohen, Lexington, MA (US);

Ishai Kedem, Brookline, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A method for scanning a disk to verify the integrity of data records stored on the disk includes comparing copies of meta-data derived from a data record to be verified. For each data record, a first copy of the meta-data for that record is stored in a cache memory and a second copy of the meta-data for that record is stored on the disk. To verify a data record, a third copy of the meta-data is made by copying the second copy to the cache-memory element. The first and third copy are then compared to verify the integrity of the data record. By reducing the number of disk accesses and eliminating the need to access the data record itself, the scanning method enables a disk to be scanned rapidly.


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