The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2003
Filed:
Nov. 30, 1999
Applicant:
Inventors:
Ji Wang, Milpitas, CA (US);
Jiun-Der Yu, Mountain View, CA (US);
Yook-Kong Yong, Princeton, NJ (US);
Tsutomu Imai, Nagano-ken, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06G 7/62 ; G06G 7/48 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06G 7/62 ; G06G 7/48 ;
Abstract
An apparatus and method for determining certain correction factors in analyzing the vibration frequency characteristics of an electroded crystal plate. The developed correction factors are introduced to correct the inaccuracies of third-order thickness-shear cut-off frequencies. The analysis is preferably carried out during the design of a piezoelectric device incorporating the electroded crystal plate before production of the device.