The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Jun. 13, 2002
Applicant:
Inventors:

Tetsuya Sugiyama, Shizuoka, JP;

Takehisa Kajiyama, Shizuoka, JP;

Yoshihiro Sei, Shizuoka, JP;

Masanori Hasegawa, Shizuoka, JP;

Assignee:

Star Micronics Co., Ltd., Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A contour shape of a desired shape of a workpiece at section along a predetermined axis is divided into machining units. Each of the machining units includes a plurality of inflection points including a machining start point and a machining end point. Machining data at least necessary for performing machining is set for each of the machining units. Arrival times at the inflection points are calculated based on the machining data, and a position of at least one of the workpiece and the tool is calculated for each of the inflection points. For each of the machining units, a rotation angle position of the workpiece corresponding to the arrival time is set as an accumulated count value.


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