The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Mar. 12, 2002
Applicant:
Inventors:

Michael A. Scobey, Santa Rosa, CA (US);

Lucien P. Ghislain, San Rafael, CA (US);

Dennis J. Derickson, Windsor, CA (US);

Loren F. Stokes, Santa Rosa, CA (US);

Assignee:

Cierra Photonics, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/26 ; G02B 6/42 ; H04J 1/402 ; H04J 1/400 ;
U.S. Cl.
CPC ...
G02B 6/26 ; G02B 6/42 ; H04J 1/402 ; H04J 1/400 ;
Abstract

An optical system and method are disclosed for multiplexing or de-multiplexing channels within a wavelength band. The optical signals carried on the system comprise separate channels through n, each having a unique passband and a center wavelength spaced from the center wavelength of adjacent channels by d nm. The signals are semi-multiplexed, demultiplexed, or semi-demultiplexed by an interleaver comprising optically matched and directly optically coupled etalons. Periodic spectral passbands of width less than d nm, spaced from each other a distance of zd, where z is an integer greater than or equal to 3, are substantially transmitted through the interleaver. At least one of the etalons is a bulk optic etalon and comprises first and second selectively transparent thin film mirror coatings on opposite surfaces of a bulk optic that defines the cavity spacing of that etalon.


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