The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2003
Filed:
Jul. 11, 2002
Gregory Alan Mohr, Scotia, NY (US);
Elizabeth Lokenberg Dixon, Delanson, NY (US);
Michael Robert Hopple, Schenectady, NY (US);
August David Matula, Sloansville, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An image identification and quality indication system for radiographic inspection includes a flexible substrate, for positioning on a surface of an object to be inspected, and a number of locators and image quality indicators arranged on the flexible substrate. Each locator is configured for indicating a position on the object's surface in a respective radiographic image (image). Each image quality indicator is configured to indicate an image quality of the respective image. An image identification and quality indication method for radiographic inspection includes positioning the flexible substrate on the object's surface, including aligning the locators with a number of visible features on object's surface. The method further includes forming at least one reference mark and image quality mark in each of a number of images of the object, using a locator and image quality indicator, respectively. Each reference mark correlates the respective image with a position on the object.