The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2003
Filed:
Aug. 05, 2002
Applicant:
Inventors:
Tadashi Kajino, Okazaki, JP;
Osamu Mita, Gamagori, JP;
Assignee:
Nidek Co., Ltd., Gamagori, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ;
Abstract
A lens meter capable of easily measuring optical characteristics of far and near viewing sections of a multifocal lens to obtain optical characteristics of a multifocal lens. The lens meter comprises a first measurement optical system having a first measurement optical axis, for measuring optical characteristics of a far viewing section of a multifocal lens, and a second measurement optical system having a second measurement optical axis which is different from the first measurement optical axis, for measuring optical characteristics of a near viewing section of the multifocal lens.