The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2003
Filed:
Sep. 25, 2001
Jobin Yvon S.A., Longjumeau, FR;
Abstract
The invention concerns an apparatus for optically characterising a thin-layer material by backscattering Raman spectometry comprising a frame, a monochromatic excitation laser source ( ), optical means ( ) directing a light flux emitted by the source towards the material to be characterised, provided with means ( ) homogenising the distribution of energy per surface unit, over a minimum surface of some tens of square micrometers, and means for collecting ( ) and selecting ( ) the light diffused by Raman effect. The apparatus further comprises reflectometric measuring means ( ) integral with the Raman measuring means, including reflectometric excitation means ( ) directed on the same sample zone as the Raman excitation means.