The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Sep. 30, 1999
Applicant:
Inventors:

Rama R. Goruganthu, Austin, TX (US);

Antonio Torres Garcia, Austin, TX (US);

Michael R. Bruce, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/1302 ; G01R 3/102 ; G01R 3/100 ;
U.S. Cl.
CPC ...
G01R 3/1302 ; G01R 3/102 ; G01R 3/100 ;
Abstract

An apparatus, system, and method are provided for testing an integrated circuit with a probe card having optical fibers. The optical fibers of the probe card are fixed in alignment with test structures in the integrated circuit, and each optical fiber is coupled to an avalanche photo-diode for measuring photoemissions from the test structures. The photoemissions can be analyzed to verify correct circuit behavior. The optical fibers can be alternatives or complements to electrically conductive probes of the probe card.


Find Patent Forward Citations

Goruganthu, Rama. (2003). Picosecond imaging circuit analysis probe and system (U.S. Patent No. 6657446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6657446

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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