The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6657438 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 02, 2003

Filed:

Oct. 15, 2001
Applicant:
Inventor:

Nobuhiro Suzuki, Yokkaichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 3/104 ; H01H 3/00 ; G01R 3/102 ;
U.S. Cl.
CPC ...
H01H 3/104 ; H01H 3/00 ; G01R 3/102 ;
Abstract

A testing apparatus ( ) is provided to securely detect a mounting error of a fittable member ( ) on a connector ( ). The testing apparatus ( ) has a testing unit ( ) for detecting an ajar state of the fittable member ( ) on a housing ( ) of a connector ( ). The testing unit ( ) is provided with an elastic contact ( ) for elastically contacting the housing ( ) of the connector I ) along locking direction (Y) in which the fittable member ( ) is locked with the housing ( ). This elastic contact ( ) is provided with a switch ( ) for detecting the ajar state of the fittable member ( ) at a contact position of the elastic contact ( ) with the housing ( ).


Find Patent Forward Citations

Suzuki, Nobuhiro. (2003). Testing unit and a connector testing apparatus using the same (U.S. Patent No. 6657438). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6657438

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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