The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Apr. 24, 2002
Applicant:
Inventor:

Jun Katsuragawa, Okazaki, JP;

Assignee:

Nidek Company, Limited, Gamagori, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 3/10232 ;
U.S. Cl.
CPC ...
H01L 3/10232 ;
Abstract

A transparent substrate with a multilayer antireflection film having electrical conductivity is disclosed. On a polycarbonate substrate (a refractive index of 1.58) with a hard coat, a first thin-film layer whose main component is SiO is formed with a thickness of 142.5 nm (approx. &lgr;/4 for a wavelength of 550 nm). A second thin-film layer whose main component is TiO is formed with a thickness of 124.0 nm on the first thin-film layer. Furthermore, a third thin-film layer whose main component is indium tin oxide (ITO) is formed with a thickness of 150.0 nm on the second thin-film layer.


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