The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6657202 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 02, 2003

Filed:

Jun. 13, 2001
Applicant:
Inventors:

Satoshi Mikami, Naka-gun, JP;

Hirohide Kobayashi, Naka-gun, JP;

Mitsuru Kamei, Mito, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 ;
U.S. Cl.
CPC ...
G01T 1/00 ;
Abstract

A dose distribution-measuring method capable of grasping a three-dimensional form of an object to be measured or evaluating a three-dimensional dose distribution thereof. The method comprises providing a multiple-eye type radiation meter probe in which at least two directional radiation detectors are arranged so as to be spaced from each other and directed toward a point to be measured; and carrying out dose measurement by directing the radiation meter probe toward an object to be measured from different positions to thereby determine a three-dimensional dose distribution of the object to be measured. Each of the radiation detectors has a structure in which a periphery of the radiation detector main body, except for a detection surface thereof, is surrounded by a radiation shield to reduce the effect of radiation from other than the object to be measured and from Compton scattering.


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Mikami, Satoshi. (2003). Multiple-eye type dose distribution measuring method (U.S. Patent No. 6657202). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6657202

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