The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Dec. 14, 2001
Applicant:
Inventors:

Sanjeev Sharma, Waukesha, WI (US);

Hui Ann Liew, Evanston, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

A method and apparatus are disclosed for monitoring multiple ultrasound scanners of differing platform types for system events, acquiring system event data of the ultrasound scanners, and transferring the system event data to a remote location by applying a common data mining module and log viewer component in each scanner to act as an interface between a web server and control processing section within the scanners. A computer at an automated support center that is remote to the scanners interfaces to the web servers of the scanners over a network. The remote computer has a web browser to survey the scanners by communicating with the web servers over the network. The data mining module continuously monitors the scanners for system events. Log files are generated within the scanners during normal operation of the scanner. The log viewer component translates system event log files within the scanners in response to internal requests occurring in the scanners at regular, pre-defined time intervals. The system event information is displayed to an operator at the automated support center and/or formatted to provide to a customer for each scanner.


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