The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2003

Filed:

Feb. 13, 2002
Applicant:
Inventors:

Stefan Boehm, Zirndorf, DE;

Martin Spahn, Erlangen, DE;

Boris Stowasser, Erlangen, DE;

Assignee:

Siemens Aktiengesellschaft, Münich, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/800 ;
U.S. Cl.
CPC ...
G01D 1/800 ;
Abstract

In an X-ray diagnostic installation and correction method wherein comet artifacts in the unprocessed image can be corrected, a geometrical analysis of the comet artifacts is implemented, an estimated reference value is determined from the original signal using the analysis result, an estimated detail signal is determined from the original signal using the analysis result, and the comet artifacts are corrected on the basis of the estimated reference value and the estimated detail signal.


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