The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2003
Filed:
Mar. 27, 2001
Applicant:
Inventor:
Masanao Fujieda, Toyohashi, JP;
Assignee:
Nidek Co., Ltd., Gamagori, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract
An ophthalmic apparatus comprising a first input unit with which plural measurement data concerning an eye to be examined are inputted, a second input unit with which images of the eye including an anterior eye segment are inputted, each of the image is photographed at the time of measuring each of the inputted measurement data, and a calculation and control unit which detects and corrects two-dimensional displacement or deviation between each of the measurement data based on each of the inputted images of the eye.