The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

Jun. 15, 1999
Applicant:
Inventors:

Ji Wang, Sunnyvale, CA (US);

Jiun-Der Yu, Mountain View, CA (US);

Yook-Kong Yong, Princeton, NJ (US);

Tsutomu Imai, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 1/710 ; G06F 7/60 ; G06G 7/62 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 1/710 ; G06F 7/60 ; G06G 7/62 ;
Abstract

Techniques are provided for determining certain correction factors and using these correction factors in analyzing the vibration frequency characteristics of a piezoelectric material. The correction factors are developed based on the Mindlin plate theory and are introduced to correct the inaccuracies of higher-order thickness-shear cut-off frequencies. The analysis is preferably carried out during the design of a piezoelectric device incorporating the piezoelectric material and before production of the piezoelectric device. The design state may also include determining whether the device and its electrodes exhibit appropriate stiffness characteristics.


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