The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

Sep. 25, 2001
Applicant:
Inventors:

Jeffrey Lubin, Pennington, NJ (US);

Michael Henry Brill, Morrisville, PA (US);

Assignee:

Sarnoff Corporation, Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/12 ;
U.S. Cl.
CPC ...
H04N 7/12 ;
Abstract

A method and apparatus for assessing the visibility of differences between two input signal sequences, e.g., image sequences is disclosed. The apparatus comprises a perceptual metric generator having an input signal processing section, a luminance processing section, a chrominance processing section and a perceptual metric generating section. The luminance processing section simultaneously processes at least two image fields, so as to provide spatio-temporal channels whose calibration is independent of pure-spatial and pure-temporal channels.


Find Patent Forward Citations

Lubin, Jeffrey. (2003). Method and apparatus for assessing the visibility of differences between two signal sequences (U.S. Patent No. 6654504). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6654504

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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