The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2003
Filed:
Nov. 29, 2001
Hiroyuki Minemura, Kokubunji, JP;
Hiroyuki Tsuchinaga, Kodaira, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method of recording information on an information medium, especially on an optical recording medium with light. It has been hard to determine optimum power accurately due to the influence of the linearity and the mark length dependence on rewrite deterioration when a write parameter calibration on a phase change optical disk is performed by a conventional asymmetry method prior to information recording. According to the present invention, a single pattern or a random pattern is recorded on an information medium, and the difference between the clock and the data edge is detected using a reproduced signal. On the basis of this difference, the threshold power of the recording is determined and multiplied by a constant to optimize the recording power.