The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2003
Filed:
Dec. 28, 2001
Ruediger Friedrich Berger, Heidesheim, DE;
Peter Karl Maechtle, Mainz, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for in-situ measuring a temperature and/or temperature distribution within a slider due to local heat transfer is provided, whereby the slider is positioned above the surface of a rotating disk, and carries a sensor and/or write element, whereby the rotating disk is moving relatively to the sensor and/or write element, and whereby the shape of said slider is changed locally due to the temperature and/or temperature distribution. By measuring the shape changes of the slider, the temperature and/or temperature distribution can be calculated on the basis of the changes by means of numerical methods. The method may be used as an in-situ measurement in already existing testers, like, e.g., flying height testers. No additional hardware is required and studies of the slider near contact can be performed. In addition, information with respect to the flight height is obtained simultaneously.