The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2003
Filed:
Sep. 21, 2001
Applicant:
Inventors:
Michael B. North Morris, Santa Rosa, CA (US);
David M. Braun, Santa Rosa, CA (US);
Gregory S. Hill, Santa Rosa, CA (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
An interferometer system is used to detect a wavelength of an unknown signal. The interferometer system includes a fringe pattern detection system and a power detecting system. The fringe pattern detection system measures an interference fringe pattern of the unknown signal. The power detecting system measures relative power of the unknown signal before the unknown signal enters the fringe pattern detection system. The relative power of the unknown signal is used to compensate for modulation within the unknown signal.