The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

Oct. 12, 2001
Applicant:
Inventors:

Eiji Kimura, Tokyo, JP;

Motoki Imamura, Tokyo, JP;

Toshio Kawazawa, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A technique for measuring optical characteristics includes providing a variable wavelength light source a fixed wavelength light source optical modulators for modulating the variable wavelength light and the fixed wavelength light, a fiber coupler for entering composite light generated by composing the variable wavelength light with the fixed wavelength light into a device under test, a circulator for extracting a variable wavelength light component from light transmitted through a fiber pair, and an optical filter for extracting a variable wavelength light component from the transmitted light, and measuring a phase difference of the variable wavelength light component with the fixed wavelength light component as a reference.


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