The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2003
Filed:
Oct. 24, 2001
Mario A. Cugini, Vista, CA (US);
Jeff Brakley, San Diego, CA (US);
Gilbert Norman Ravich, Lawndale, CA (US);
Eric Ford, La Canada, CA (US);
Lomanoha Ventures, Vista, CA (US);
Abstract
The present invention relates to a method and apparatus for testing electrical traces wherein ultraviolet wavelengths from a laser source and visible wavelengths from a scanning camera are focused to a common focal plane. In a first embodiment of the method and apparatus, the wavelengths are commonly focused using an auxiliary lens having a power sufficient to accommodate the difference between the focusing plane of the ultraviolet laser source and the scanning camera. In a second embodiment, the wavelengths are commonly focused by moving the camera optics of the scanning camera relative to its visible light source. Both of these methods and apparatuses employ a fused silica lens system, avoiding the use of calcium fluoride.