The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2003
Filed:
Sep. 30, 2002
Justin L. Gaither, Austin, TX (US);
Marwan M. Hassoun, Austin, TX (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
An integrated circuit includes analog test cells to determine if an analog signal is within a predetermined voltage or current range. The test cell uses one or more analog reference signals to establish boundaries of a test range. Different embodiments of the analog test cells selectively test multiple analog signals provided in an integrated circuit. A test system can be provided to test multiple analog signals of an integrated circuit by scanning multiple analog test cells distributed throughout the integrated circuit and providing the test data for analysis. An analog circuit of an integrated circuit can be tested at different stages in manufacturing, including during a wafer stage prior to separation of individual circuit dice. Further, analog circuitry can be tested and characterized without the need for analog or digital/analog testers. In contrast, a digital only tester can be used to test analog circuitry.