The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

Mar. 06, 2002
Applicant:
Inventors:

Laurent Launay, Saint Remy les Chevreuse, FR;

Andreas Rick, Schwerte, DE;

Serge Muller, Guyancourt, FR;

Sophie Seggar, Malakoff, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/60 ; G01D 1/800 ;
U.S. Cl.
CPC ...
H05G 1/60 ; G01D 1/800 ;
Abstract

A method of calibration for reconstructing three-dimensional models from images obtained by a tomography apparatus comprising a radiation detector and an X-ray source which can move with respect to the detector. In the method a set of markers are placed in the field of the X-rays and the positions of the projections of the markers onto the images acquired are processed so as to deduce from this the position of the source at the time of acquisitions, the markers being carried by one and the same support. The markers are fixed with respect to the support and the positions of the projections of the markers onto the images acquired are processed so as to deduce from this the position of the markers in space.


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