The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

Nov. 16, 2001
Applicant:
Inventor:

Klaus Joachim Zanker, Houston, TX (US);

Assignee:

Daniel Industries, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/37 ;
U.S. Cl.
CPC ...
G01F 1/37 ;
Abstract

A measurement system is described that includes a flow conditioner for performing the dual functions of conditioning the flow stream and acting as a check meter to the primary meter. Various flow stream characteristics are calculated from the measured differential pressure across the flow conditioner. These calculated values are compared to measurements made by the primary meter for the purpose of identifying performance or accuracy problems in the measurement equipment.


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