The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Apr. 10, 2000
Applicant:
Inventors:

Sharon Sheau-Pyng Lin, Cupertino, CA (US);

Ping-Sheng Tseng, Sunnyvale, CA (US);

Chwen-Cher Chang, Fremont, CA (US);

Su-Jen Hwang, Los Altos, CA (US);

Assignee:

Axis Systems, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

In a verification system, a dynamic logic evaluation system and method dynamically calculates the minimum evaluation time for each input. Thus, this system and method will remove the performance burden that a fixed and statically calculated evaluation time would introduce. By dynamically calculating different evaluation times based on the input, 99% of the inputs will not be delayed for the sake of 1% of the inputs that actually need the worst possible evaluation time. The dynamic logic evaluation system and method comprises a global control unit coupled to a propagation detector, where the propagation detector is placed in each FPGA chip. The propagation detector in the FPGA chip alerts the global control unit of any input data that is currently propagating within the FPGA chips. A master clock controls the operation of this dynamic evaluation system and method. As long as any input data is propagating, the global control unit will prevent the next input from being provided to the FPGA chips for evaluation. Once the output has stabilized, the global control unit will then instruct the system to accept and process the next set of input data. Thus, the global control unit in conjunction with the propagation detectors can dynamically provide varying evaluation time periods based on the needs of the input data. Whether the system needs longer or shorter evaluation times, the system will dynamically adjust the amount of time necessary to properly process that input and then move on to the next evaluation time for the next set of inputs.


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