The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Aug. 17, 2000
Erwin Lehmann, Berlin, DE;
Deutsche Telekom AG, Bonn, DE;
Abstract
Pseudo-random sequences (PRS) are used for measuring bit error structures in digital transmission paths, into which sequences labels in the form of test error sequences are inserted at a defined site in the pattern. Often it is not possible to mark the measured data at the sender's end, if, for example, the PRS measuring devices do not allow a label fade-in at the sender's end in end-to-end measurements in international data exchange. The invention provides a means for subsequently providing PRS labels. In a method for measuring bit error structures of a digital transmission channel of a digital transmission link, a marking of transmitted quasirandom sequences takes place at the receiving end. The marker is switched on at the receiver's end before a bit-by-bit comparator and the quasirandom sequence marking is synchronized with the quasirandom sequence signal received from the sender's end. The marking at the receiver's end is adapted to a known marking at the sender's end with respect to the site in the pattern, frequency and number of clock periods. The quasirandom sequence marking may be used to assign slips and systematically occurring bit errors in the transmission path to certain devices. To-the-bit determination of cell losses is ATM measurements is possible.