The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Mar. 23, 2001
Ye Fu, Vaughan, CA;
Seyhan Nuyan, Thornhill, CA;
Metso Automation Oy, Helsinki, FI;
Abstract
A multivariable analysis tool is provided wherein an orthogonal decomposition method such as a Partial Least Squares algorithm is applied to a disturbance model, which relates the known loop disturbances to the loop model residue. The tool according to the invention first extracts the most dominant correlation to the loop model residue and then uses the residue to search for secondary dominant correlation in an orthogonal space, and repeats this process until no further output variation can be significantly attributed by the next dominant correlation. In this way, the analysis tool of the present invention is able to estimate the performance potential of each control loop under different disturbance conditions and provide a control performance index by comparing the achieved performance to the performance potential in a multi-variable environment. This index indicates whether or not a given loop is under optimal operation and shows variance of the loop from the best achievable loop performance.