The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Apr. 27, 2000
Applicant:
Inventors:

Philippe Tarbouriech, San Francisco, CA (US);

Gilles van Ruymbeke, Menlo Park, CA (US);

Assignee:

Microvision, Inc., Bothell, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 ;
U.S. Cl.
CPC ...
H04Q 7/20 ;
Abstract

A method and system for identifying data locations or uniform resource locators associated with physical observations in the real world. The method and system includes selecting certain physical parameters based upon an observation of real world objects and events and associating such physical parameters with data locations on the Internet or other computer network. When the real world object is observed or a real world event occurs, physical parameters relating to the object or event are sensed and recorded. These stored physical parameters are then communicated to a database, which returns a data location corresponding to the observed physical parameters. Thus, the present invention allows a user to “click” on objects or events in the real world in order to find data locations related to the objects or events in the on-line world.


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