The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Nov. 26, 1999
Applicant:
Inventor:

Shigeru Wakashiro, Tokyo, JP;

Assignee:

Pentax Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A first points range of high brightness and a second points range of high brightness in a photographed image are selected. It is checked if an identical end point is shared by the three and four points range selected. A first straight line, connecting a center of gravity corresponding to the identical end point and a center of gravity corresponding to another end point of the first points range opposite to the identical end point, is calculated. A second straight line, connecting the center of gravity corresponding to the identical end point and a center of gravity corresponding to another end point of the second points range opposite to the identical end point, is calculated. It is checked if an angle, defined by the first and second straight lines, is within a predetermined limit.


Find Patent Forward Citations

Wakashiro, Shigeru. (2003). Device for calculating positional data of standard points of a photogrammetric target (U.S. Patent No. 6650764). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6650764

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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