The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Jun. 11, 1999
Brian Buchanan, Overland Park, KS (US);
Carl Thomas Gray, Apex, NC (US);
Christopher G. Riedle, Apex, NC (US);
Raymond Paul Rizzo, Hillsborough, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A device and method that adjust data due to temperature variations is disclosed. The data is captured in a multi-stage delay line. A first controller parses the data and identifies an Edge value and an Edge value for bits in the delay line. The edge values are used to generate signals that set a Multiplexer (MUX ) and a Multiplexer (MUX ) to select bits from the delay line. A second controller processes an edge sample from bits in the delay line to determine if the data has shifted in the delay line relative to the current multiplexer settings. An edge sample is a snapshot of the delay line values. The new edge values generated by the second controller are selectively filtered and integrated with initial edge values to generate new settings for the MUX and MUX