The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Feb. 23, 2001
Applicant:
Inventors:

Hiroaki Suzuki, Machida, JP;

Kaoru Umemura, Fujisawa, JP;

Akira Shibata, Sagamihara, JP;

Tatsuya Endoh, Fujisawa, JP;

Takao Matsui, Yamato, JP;

Masaomi Ikeda, Yokohama, JP;

Junji Hashimoto, Yamato, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 2/736 ;
U.S. Cl.
CPC ...
G11B 2/736 ;
Abstract

An RW offset setting method which includes recording a test pattern by a write head, reading the test pattern by a read head, measuring an amplitude of a read back signal at each tracking position, finding an approximate expression of a profile of the measured amplitude, finding a tracking position, and finding a RW offset based on this tracking position, setting a RW offset for all tracks in the disk device based on the RW offsets about the plurality of tracks to be measured. A read data error recovery method that includes the steps of determining an off-track direction where the amplitude increases, searching an off-track position where the amplitude becomes a local maximum, measuring the amplitude at each off-track position reading data recorded in the data sector.


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