The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Mar. 25, 2002
Applicant:
Inventor:

Hans Matthiessen, Bad Schwartau, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

An optical absorption measuring instrument for determining the percentage of a component in a fluid shall be improved such that changes in the measuring radiation caused by drift or temperature have only a limited effect on the measuring result. Provisions are made for deflecting the measuring beams ( ) from a radiation source ( ) to a detector ( ) by at least two plane mirrors ( ), which are positioned such that the measuring beams ( ) emitted by the radiation source ( ) are deflected to the detector ( ). The surface of each plane mirror ( ) is dimensioned to be such that its illuminated surface in the area of the detector ( ) is larger than the receiving surface ( ) of the detector ( ).


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