The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Jun. 20, 2000
Applicant:
Inventor:
Haruo Shimaoka, Nara, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract
In a method of monitoring specific microbe in water, a monitored object water is supplied into a flow cell provided in a particle size analyzer based on the laser diffraction method, and by irradiating a laser beam to the flow cell, a spatial intensity distribution of the diffraction and scattering light by a group of the particles contained in the monitored object water is measured to obtain a particle size distribution of the group of the particles. Accordingly, information relating to a possibility of an existence of the specific microbe with a known diameter in the monitored object water can be obtained.