The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Sep. 12, 2001
Applicant:
Inventors:
Simon Thibault, Sainte-Foy, CA;
Carl Paquet, San Jose, CA (US);
Assignee:
Institut National d'Optique, Quebec, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 ; G01J 3/18 ;
U.S. Cl.
CPC ...
G01J 3/28 ; G01J 3/18 ;
Abstract
A linear spectrometer for spectrally measuring an optical signal. The spectrometer has an input receiving the signal which is then diffracted onto a diffraction grating. The signal is therefore divided into its spectral components, each component being diffracted at an angle &thgr;. A correcting element, such as a lens, a group of lenses, a mirror, etc. is provided for focusing the spectral components on an image plane where they are detected. The correcting element is designed so that the resulting distribution of the spectral components on the image plane is linear with respect to the component's wavelength.