The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Sep. 09, 2002
Applicant:
Inventors:

Louis B. Allard, Ottawa, CA;

Jonathan Paradis, Boucherville, CA;

John C. Martinho, Ottawa, CA;

Assignee:

JDS Uniphase Inc., Ottawa, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

In order to calibrate an apparatus for measuring the polarization dependent loss of an optical device under test, a set of nominal polarization states of incident light are generated with a polarization generator. The incident light is then passed through a dot-product conserving polarization rotator at a first setting. A transmission characteristic is measured through a standard optical component with a known polarization dependent loss value for each polarization state. This step is repeated for a number of different settings of the polarization rotator. A polarization dependent loss value is calculated for the standard optical component based on the measured transmission characteristics at each polarization rotator setting. The calculated polarization dependent loss values are then processed to generate an aggregate error value. The aggregate error value is minimized by adjusting the values of the nominal polarization states to estimate the actual polarization states, which can then be used to calculate the polarization dependent loss of an optical device whose value is unknown.


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