The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

May. 25, 2001
Applicant:
Inventors:

James K. Lucey, Hemlock, NY (US);

Barry Klimuszka, Rochester, NY (US);

Arthur A. Whitfield, Rochester, NY (US);

Andrew R. LaPietra, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 2/752 ; G01N 2/904 ; G01H 3/12 ; G06K 9/74 ; G01J 1/00 ;
U.S. Cl.
CPC ...
G03B 2/752 ; G01N 2/904 ; G01H 3/12 ; G06K 9/74 ; G01J 1/00 ;
Abstract

A media width detecting system is adapted to measure an absolute width of media without the need for human intervention or without the need for media to be referenced against a known location. The media width detecting system includes a measuring pattern that is provided across a media path for media. The measuring pattern can be in the form of, for example, a bar code pattern. The system further includes a reader that is provided relative to the measuring pattern so as to read the width of the measuring pattern. When media traverses the measuring pattern, a portion of the measuring pattern, for example, a subset of the bars of the bar code pattern, is covered by the media. The reader would then be adapted to determined a width of the measuring based on the covered portion of the media pattern in relation to the uncovered portion or uncovered bars.


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